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2020
6th Annual ICP Conference: Virtually Everything You Need to Know

For all ICP-MS and ICP-OES users

September 21-25, 2020

Registration - $199

The show must go on! In the wake of global health and travel concerns, we have decided to host our annual ICP Conference virtually.

Learn from some of the brightest minds in the industry during our in-depth, 5-day virtual conference covering the basic ICP techniques and how to trouble shoot! Enjoy detailed presentations, virtual roundtable discussions, video feed into the lab and interactive networking opportunities.

Registering for the conference will give you access to all presentations so you can choose the ones that interest you most! Speakers will also host live Q&A after each.

Can’t attend on the specified dates? All sessions will be recorded for registrants to access at their own convenience.

Location: Virtual Event

View our list of speakers

Agenda

Monday, September 21

  • 9:00 – 9:15 Welcome and Speaker Introduction
  • 9:15 – 9:45 Basic Needs and Considerations for a Trace Analysis by ICP — Thomas Kozikowski
  • 9:45 – 10:30 ICP Instrument Maintenance and Tuning — Michael Booth
  • 10:30 – 11:00 Part 1 - ICP-MS: Limits and Reliable Measurements — Brian Alexander, Ph.D.

Tuesday, September 22

  • 9:00 – 9:30 Part 2 - ICP-MS: Limits and Reliable Measurements — Brian Alexander, Ph.D
  • 9:30 – 10:00 Fundamentals of Method Validation — Lesley Owens, Ph.D.
  • 10:00 – 11:00 Sample Preparation Building Blocks — Part 1- Paul Gaines, Ph.D.

Wednesday, September 23

  • 9:00 – 10:00 Trace Metals Analysis of Multi-Element Standards by ICP-OES - Thomas Kozikowski
  • 10:00 – 11:00 Sample Preparation Building Blocks — Part 2 Paul Gaines, Ph.D.

Thursday, September 24

  • 9:00 – 9:45 ICP-MS: Planning for Tough Samples and Problem Elements — Brian Alexander, Ph.D.
  • 9:45 – 10:45 ICP Calibration Standards: Design, Handling and Troubleshooting — James King
  • 10:45 – 11:00 Part 1 - Application of Basic Statistics in Measurement Uncertainty — Lesley Owens, Ph.D. 

Friday, September 25

  • 9:00 – 9:30 Part 2 - Application of Basic Statistics in Measurement Uncertainty — Lesley Owens, Ph.D.
  • 9:30 – 11:00 Roundtable Discussion/Open Q&A Forum