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Contamination From the Analyst and ApparatusTrace Analysis Guide: Part 10Part 8, Environmental Contamination, discussed the importance of a clean room to reduce air contaminants while performing trace analyses. A clean room is equally important for minimizing contamination from the analyst. Contamination From the AnalystThe area pictured in figure 10.1 is the buffer zone between the outside air and the main clean room. Air entering with the analyst is filtered (at the rate of 1.5 times per minute) before the analyst enters the main clean area. A cart contains a HEPA vacuum used for cleaning objects to be taken into the main clean room. A ‘sticky mat' on the floor just inside the room will remove shoe dust and other contaminants. Another sticky mat (not pictured) is placed just before the entry way to the buffer zone. ![]() The analyst pictured here is wearing disposable "clean room" clothing. There are three separate pieces (head covering, foot covering, and main coverall). The clothing is worn over normal street clothes and should never leave the clean room area. Common Contaminants
Tips for the Analyst
TIP: Dangerous operations require appropriate laboratory clothing REGARDLESS of the potential for contamination. Apparatus ContaminationAnother potential source of contamination is casued by the apparatus that comes into contact with the sample. Careful planning is required by the analyst as to the type of apparatus that comes into contact with a particular trace metals analysis. All apparatus should be specified in the procedure along with any cleaning procedures or special precautions. Although the type and degree of contamination that occurs when using certain apparatus can be predicted, the importance of one or more blanks with every preparation should be apparent from the following table.
Table 10.1: Results of Spectrochemical Analysis
(Hydrogen Fluoride, Hydrogen Chloride, and Nitric Acid [all high purity] analyzed after evaportation in Teflon, Platinum, and Quartz dishes) ![]() Elements determined, ng/g A Closer Look at QuartzQuartz is a popular material for apparatuses used in trace elemental analysis. There are two types of quartz: opaque and transparent. Opaque quartz has the highest trace element concentration and should not be used for trace analysis. Transparent quartz (types I and II) are made from naturally occurring quartz crystals or sands. Type I is made by electric melting and type II by flame melting. Type II has slightly less impurities than type I (some impurities are volatilized by the flame). Type III quartz is made synthetically by vapor phase hydrolysis of pure silicon compounds such as SiCl4. This type of quartz is more pure than the natural quartz with the exception of Cl - which is ~ 50 ppm. Type IV quartz is synthetically made from SiCl4 using a process involving electrical fusion of the oxidized staring material. It is as pure as type III, with respect to trace metal content, and contains much more Cl-. Use synthetic quartz whenever possible. Table 10.2 shows typical impurities in natural and synthetic quartz. ![]() ND = Not detected Table 10.3 shows a comparison of impurities in natural quartz to other common laboratory apparatus. ![]() Figure 10.2 demonstrates how quartz is the cleanest of all sample container materials that can withstand typical ashing temperatures (T > 400 °C). Figure 10.2: Container Materials in order of Increasing Impurites1 Apparatus Tips
1. T. Murphy, National Bureau of Standards Special Publication 422, "Accuracy in Trace Analysis: Sampling, Sample Handling, and Analysis", Proceedings of the 7th IMR Symposium. Further Reading |